Archive for the ‘Reliability analysis’ Category

Lockheed Martin: Electromagnetic Pulse Modeling

January 31st, 2012 No comments

EMP blast effects

Client: Lockheed Martin Missiles and Fire Control
Team: Stephen Beckert, Brandon Joslin, Pierce, Meier
Faculty Advisor: Dr. Barr
Year: 2010
Documents: Final Report, Presentation

Lockheed Martin presented us with a project more exciting than we could ever imagine: aiding the research into ways to model the effects of an Electromagnetic Pulse (EMP). EMP is extremely devastating and can be caused by both natural and man-made events. EMP primarily affects electronic devices, rendering them useless or destroyed. Since the United States is heavily dependent on electronic interfaces, we are extremely vulnerable to this effect. In addition to this vulnerability to the EMP effect, the United States has a complex system of connected critical infrastructures that have not been studied as interrelated systems. This presents a major problem, how can one forecast the possible failures of such a massive complex system? Read more…